SiO2-supported Pt particles studied by electron microscopy

Materials Chemistry and Physics

Volumn 81, Issue 2-3, 2003, Pages 341-344

  Wang, D ^a   Penner, S ^b   Su, D S ^a   Rupprechter, G ^a   Hayek, K ^b   Schlogl R ^a  

^a FRITZ HABER INSTITUT DER MAX PLANCK GESELLSCHAFT   (Germany)

^b UNIVERSITY OF INNSBRUCK   (Austria)

Author keywords

Electron diffraction; High resolution electron microscopy; Platinum silicide; Strong metal support interaction

Indexed keywords

COALESCENCE; ELECTRON DIFFRACTION; HIGH RESOLUTION ELECTRON MICROSCOPY; PARTICLES (PARTICULATE MATTER); SILICA;

STRUCTURAL TRANSFORMATION;

AMORPHOUS MATERIALS;

EID: 0038373457     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0254-0584(03)00017-8     Document Type: Conference Paper

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