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Volumn 81, Issue 2-3, 2003, Pages 566-568

Transmission electron microscopy investigation of the microstructure and chemistry of Si/Cu/In/Cu/Si interconnections

Author keywords

Cu In system; Diffusion soldering; Intermetallics; Isothermal solidification

Indexed keywords

CHEMICAL BONDS; ENERGY DISPERSIVE SPECTROSCOPY; METALLIZING; SILICON COMPOUNDS; SOLDERING; TRANSMISSION ELECTRON MICROSCOPY; X RAY ANALYSIS;

EID: 0038373430     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0254-0584(03)00076-2     Document Type: Conference Paper
Times cited : (26)

References (13)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.