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Tian, X.1
Bhushan, B.2
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78
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0002037432
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The properties of random surface of significance in their contact
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Whitehouse DJ and Archard JF (1970), The properties of random surface of significance in their contact, Proc. R. Soc. London, Ser. A 316, 97-121.
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Whitehouse, D.J.1
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79
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0026815539
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Simulation of 3-D random surface by 2-D digital filter and Fourier analysis
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Hu YZ and Tonder K (1992), Simulation of 3-D random surface by 2-D digital filter and Fourier analysis, Int. J. Mach. Tools Manuf. 32, 82-90.
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Hu, Y.Z.1
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81
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17644434828
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The contact of surfaces having a random structure
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Onions RA and Archard JF (1973), The contact of surfaces having a random structure. Bull. Obs. Astron. Belgrade 6, 289-304.
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Onions, R.A.1
Archard, J.F.2
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82
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13444294217
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Transient dynamic analysis of the sliding contact of layered elastic/plastic solids
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submitted
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Peng W and Bhushan B (2002), Transient dynamic analysis of the sliding contact of layered elastic/plastic solids, ASME J. Tribol. (submitted).
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(2002)
ASME J. Tribol.
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Peng, W.1
Bhushan, B.2
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83
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0029409945
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Comparison of surface roughness measurements by stylus profiler, AFM and non-contact optical profiler
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Poon CY and Bhushan B (1995), Comparison of surface roughness measurements by stylus profiler, AFM and non-contact optical profiler. Wear 190, 76-88.
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(1995)
Wear
, vol.190
, pp. 76-88
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Poon, C.Y.1
Bhushan, B.2
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84
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0034552084
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Numerical contact analysis of layered rough surfaces for magnetic head slider-disk contact
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Peng W and Bhushan B (2000), Numerical contact analysis of layered rough surfaces for magnetic head slider-disk contact, J. Info. Storage Proc. Syst. 2, 263-280.
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(2000)
J. Info. Storage Proc. Syst.
, vol.2
, pp. 263-280
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Peng, W.1
Bhushan, B.2
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85
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45549118580
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Analysis of elastic and plastic deformation associated with indentation testing of thin films on substrates
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Bhattacharya AK and Nix WD (1988), Analysis of elastic and plastic deformation associated with indentation testing of thin films on substrates. Int. J. Solids Struct. 24, 1287-1298.
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Bhattacharya, A.K.1
Nix, W.D.2
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86
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0026875935
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An improved technique for determining hardness and elastic modulus using load and displacement sensing indentation experiments
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Oliver WC and Pharr GM (1992), An improved technique for determining hardness and elastic modulus using load and displacement sensing indentation experiments, J. Mater. Res. 7, 1564-1583.
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J. Mater. Res.
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Oliver, W.C.1
Pharr, G.M.2
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88
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0033377792
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Chemical, mechanical and tribological characterization of ultra-thin and hard amorphous carbon coatings as thin as 3.5 nm: Recent developments
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Bhushan B (1999), Chemical, mechanical and tribological characterization of ultra-thin and hard amorphous carbon coatings as thin as 3.5 nm: recent developments. Diamond Relat. Mater. 8, 1985-2015.
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Diamond Relat. Mater.
, vol.8
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Bhushan, B.1
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89
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0043099799
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Micromechanical property measurements of glass and glass-ceramic substrates for magnetic thin-film rigid disks for gigabit recording
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Bhushan B, Chyung K, and Miller RA (1996), Micromechanical property measurements of glass and glass-ceramic substrates for magnetic thin-film rigid disks for gigabit recording, Adv. Inf. Storage Syst. 7, 3-17.
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(1996)
Adv. Inf. Storage Syst.
, vol.7
, pp. 3-17
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Bhushan, B.1
Chyung, K.2
Miller, R.A.3
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90
-
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0030431682
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Numerical contact and stiction analyses of Gaussian isotropic surfaces for magnetic head slider/disk contact
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Poon CY and Bhushan B (1996), Numerical contact and stiction analyses of Gaussian isotropic surfaces for magnetic head slider/disk contact. Wear 202, 68-82.
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(1996)
Wear
, vol.202
, pp. 68-82
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Poon, C.Y.1
Bhushan, B.2
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91
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0000117873
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Mechanical and tribological properties of silicon for micromechanical applications: A review
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Bhushan B and Venkatesan S (1993), Mechanical and tribological properties of silicon for micromechanical applications: A review. Adv. Inf. Storage Syst. 5, 211-239.
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(1993)
Adv. Inf. Storage Syst.
, vol.5
, pp. 211-239
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Bhushan, B.1
Venkatesan, S.2
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92
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0030146539
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Effect of normal load on micro scale friction measurements
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(1997) erratum, 293, 333
-
Bhushan B and Kulkarni A (1996), Effect of normal load on micro scale friction measurements. Thin Solid Films 278, 49-56; (1997) erratum, 293, 333.
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(1996)
Thin Solid Films
, vol.278
, pp. 49-56
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Bhushan, B.1
Kulkarni, A.2
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