Sintering and dielectric properties of 0.88Al2O3-0.12TiO2 microwave ceramics by glass addition

Materials Research Bulletin

Volumn 38, Issue 6, 2003, Pages 981-989

  Tzou, Wen Cheng ^a   Chang, Sang Li ^b   Yang, Cheng Fu ^c   Chen, Ying Chung ^b  

^a FORTUNE INSTITUTE OF TECHNOLOGY   (Taiwan)

^b NATIONAL SUN YAT SEN UNIVERSITY   (Taiwan)

^c DEPARTMENT OF ELECTRONIC ENGINEERING   (Taiwan)

Author keywords

A. Ceramics; A. Glasses; C. X ray diffraction; D. Dielectric properties

Indexed keywords

ALUMINA; GLASS; MICROSTRUCTURE; MICROWAVE DEVICES; NATURAL FREQUENCIES; PERMITTIVITY; PHASE TRANSITIONS; SINTERING; TEMPERATURE; TITANIUM DIOXIDE; X RAY DIFFRACTION ANALYSIS;

QUALITY FACTOR;

CERAMIC MATERIALS;

EID: 0038357719     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0025-5408(03)00065-5     Document Type: Article

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