An investigation of the material and process parameters for thin-film MCM-D and MCM-L technologies up to 100GHz

Proceedings - Electronic Components and Technology Conference

Volumn , Issue , 2003, Pages 478-486

  Grzyb, Janusz ^a   Ruiz, Ivan ^a   Cottet, Didier ^a   Tröster, Gerhard ^a  

^a ETH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTIC IMPEDANCE MEASUREMENT; DIELECTRIC MATERIALS; MATHEMATICAL MODELS; MICROSTRIP LINES; PERMITTIVITY; THIN FILMS;

COMPLEX PERMITTIVITY; DIELECTRIC MATERIALS PARAMETERS;

ELECTRONICS PACKAGING;

EID: 0038350878     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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