A comparison of FePt thin films with HfO2 or MnO additive

Journal of Magnetism and Magnetic Materials

Volumn 260, Issue 3, 2003, Pages 487-491

  Platt, C L ^a   Wierman, K W ^a   Howard, J K ^a   Roy, A G ^b   Laughlin, D E ^b  

^a SEAGATE RESEARCH   (United States)

^b CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

Discontinuous; FePt; HfO2; L10; MnO

Indexed keywords

ADDITIVES; COERCIVE FORCE; HAFNIUM COMPOUNDS; IRON COMPOUNDS; MAGNETIC PROPERTIES; MANGANESE COMPOUNDS; OXIDES;

OXIDE ADDITIVES;

THIN FILMS;

EID: 0038348734     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-8853(02)01386-0     Document Type: Article

References (19)

1. Coffey K., Parker M.A., Howard J.K. IEEE Trans. Magn. 31:1995;2737.
2. Maeda T., Kai T., Kikitsu A., Nagase T., Akiyama J. Appl. Phys. Lett. 80:2002;2147.
3. Lee S.-R., Yang S., Kim Y.K., Na J.G. Appl. Phys. Lett. 78:2001;4001.
4. Ping D.H., Ohnuma M., Hono K., Watanabe M., Iwasa T., Masumoto T. J. Appl. Phys. 90:2001;4708.
5. Suzuki T., Ouchi K. IEEE Trans. Magn. 37:2001;1283.
6. Chen S.C., Kuo P.C., Lie C.T., Hua J.T. J. Magn. Magn. Mater. 236:2001;151.
7. Shimatsu T., Lodder J.C., Sugita Y., Nakamura Y. IEEE Trans. Magn. 35:1999;2697.
8. Chen S.-C., Kuo P.C., Sun A.C., Lie C.T., Hsu W.C. Mater. Sci. Eng. B88:2002;91.
9. Kuo C.-M., Kuo P.C., Hsu W.-C., Li C.-T., Sun A.-C. J. Magn. Magn. Mater. 209:2000;100.
10. Li N., Lairson B.M., Kwon O.-H. J. Magn. Magn. Mater. 205:1999;1.
11. Christodoulides J.A., Farber P., Daniil M., Okumura H., Hadjipanayis G.C., Skumryev V., Simopoulos A., Weller D. IEEE Trans. Magn. 37:2001;1292.
12. Luo C.P., Liou S.H., Gao L., Liu Y., Sellmyer D.J. Appl. Phys. Lett. 77:2000;2225.
13. Luo C.P., Liou S.H., Sellmyer D.J. J. Appl. Phys. 87:2000;6941.
14. Hsu C.T., Su Y.K., Yokoyama M. Jpn. J. Appl. Phys. 31:1992;2501.
15. Schrofel J., Huttel I. Thin Solid Films. 21:1974;S3.
16. Ristau R.A., Barmak K., Lewis L.H., Coffey K.R., Howard J.K. J. Appl. Phys. 86:1999;4527.
17. Kim M.-G., Shin S.-C. J. Appl. Phys. 90:2001;2211.
18. Schuster R., Röder H., Bromann K., Brune H., Kern K. Phys. Rev. B. 54:1996;13476.
19. Karanasos V., Panagiotopoulos I., Niarchos D., Okumura H., Hadjipanayis G.C. Appl. Phys. Lett. 79:2001;1255.