Analysis of random-dopant induced fluctuations of frequency characteristics of semiconductor devices

Journal of Applied Physics

Volumn 93, Issue 8, 2003, Pages 4646-4652

  Andrei, Petru ^a   Mayergoyz, Isaak ^a  

^a UNIVERSITY OF MARYLAND   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; COMPUTATIONAL METHODS; FREQUENCIES; SEMICONDUCTOR DOPING; STATISTICAL METHODS;

FREQUENCY CHARACTERISTICS;

SEMICONDUCTOR DEVICES;

EID: 0038341898     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1557786     Document Type: Article

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