Broad band microwave probe for nondestructive test of dielectric coatings

IEEE International Symposium on Applications of Ferroelectrics

Volumn , Issue , 2002, Pages 91-93

  Grishin, A M ^a   Denysenkov, V P ^a  

^a ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

CERAMIC MATERIALS; CRACKS; DELAMINATION; DIELECTRIC MATERIALS; ELECTRIC COILS; INCLUSIONS; MICROWAVE DEVICES; NONDESTRUCTIVE EXAMINATION; PERMITTIVITY; PROBES;

MICROWAVE SCANNING PROBES (MSP);

THERMAL BARRIER COATINGS;

EID: 0038341864     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (2)

1. A.V. Dalin, P.A. Novobytov, E.A. Knyazev, R.S. Shagabeev, V.A. Nikolaev, M.L. Yakushev, G.A. Alexeev, A.V. Letunov, "Defectoscope electromagnetique", Patent FR2538553.
2. S. Hoshina, Y. Kanai, M. Miyakawa, "A numerical study on the measurement region of an open-end coaxial probe used for complex permittivity measurement", IEEE Trans. on Magn., vol. 37, pp. 3311-3314, September 2001.