Dielectric and polarization characteristics of sol-gel derived lead zirconate titanate thin films: Effect of erbium doping

IEEE International Symposium on Applications of Ferroelectrics

Volumn , Issue , 2002, Pages 111-114

  Majumder, S B ^a   Dixit, A ^a   Roy, B ^a   Jia, W ^b   Katiyar, R S ^a  

^a UNIVERSITY OF PUERTO RICO   (Puerto Rico)

^b UNIVERSITY OF PUERTO RICO   (Puerto Rico)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL LATTICES; DOPING (ADDITIVES); ERBIUM; FATIGUE OF MATERIALS; FERROELECTRIC THIN FILMS; PERMITTIVITY; POLARIZATION; SOL-GELS; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

FATIGUE RESISTANCE;

LEAD COMPOUNDS;

EID: 0038341854     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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