In situ scanning tunneling microscopy of individual supported metal clusters at reactive gas pressures from 10-8 to 104 Pa

Review of Scientific Instruments

Volumn 74, Issue 4, 2003, Pages 2444-2450

  Kolmakov, A ^a,b   Goodman, D W ^a  

^a TEXAS A AND M UNIVERSITY   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGING TECHNIQUES; MORPHOLOGY; NANOSTRUCTURED MATERIALS; NUCLEATION; SINTERING; TITANIUM DIOXIDE; TUNNEL JUNCTIONS;

REACTIVE GAS PRESSURES;

SCANNING TUNNELING MICROSCOPY;

EID: 0038341803     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1544086     Document Type: Article

References (53)

1. Chemisorption and Reactivity on Supported Clusters and Thin Films: Towards an Understanding of Microscopic Processes in Catalysis, edited by R. M. Lambert and G. Pacchioni, NATO ASI Ser. E (Kluwer Academic, Boston, 1997), Vol. 331.
2. H.-J. Freund, Surf. Sci, 500, 271 (2002); N. Nilius, A. Corper, G. Bozdech, N. Ernst, and H.-J. Freund, Prog. Surf. Sci. 67, 99 (2001).
3. H.-J. Freund, Surf. Sci, 500, 271 (2002); N. Nilius, A. Corper, G. Bozdech, N. Ernst, and H.-J. Freund, Prog. Surf. Sci. 67, 99 (2001).
4. C. T. Campbell, Surf. Sci. Rep. 27, 1 (1997).
5. C. R. Henry, Surf. Sci. Rep. 31, 235 (1998); Appl. Surf. Sci. 164, 252 (2000).
6. C. R. Henry, Surf. Sci. Rep. 31, 235 (1998); Appl. Surf. Sci. 164, 252 (2000).
7. M. Bäumer and H.-J. Freund, Prog. Surf. Sci. 61, 127 (1999).
8. T. P. St. Clair and D. W. Goodman, Top. Catal. 13, 5 (2000).
9. U. Heiz and W.-D. Schneider, J. Phys. D 33, R85 (2000).
10. P. L. J. Gunter, J. W. H. Niemantsverdriet, F. H. Ribeiro, and G. A. Somorjai, Catal. Rev. - Sci. Eng. 39, 77 (1997).
11. R. Persaud and T. E. Madey, in Growth and Properties of Ultrathin Epitaxial Layers, edited by D. A. King and D. P. Woodruf (Eisevier, Amsterdam, 1997), p. 407.
12. B. Kasemo, S. Johansson, H. Persson, P. Thormahlen, and V. P. Zhdanov, Top. Catal. 13, 43 (2000).
13. H. Poppa, Catal. Rev. - Sci. Eng. 35, 359 (1993).
14. Haruta et al., J. Catal. 144, 175 (1993).
15. M. Valden, X. Lay, and D. W. Goodman, Science 281, 1647 (1998).
16. M. Valden, S. Pak, X. Lai, and D. W. Goodman, Catal. Lett. 56, 7 (1998).
17. O. Dulub, W. Hebenstreit, and U. Diebold, Phys. Rev. Lett. 84, 3646 (2000); R. A. Bennett, P. Stone, and M. Bowker, Faraday Discuss. 114, 267 (1999).
18. O. Dulub, W. Hebenstreit, and U. Diebold, Phys. Rev. Lett. 84, 3646 (2000); R. A. Bennett, P. Stone, and M. Bowker, Faraday Discuss. 114, 267 (1999).
19. A. Berko, G. Menesi, and F. Solymosi, J. Phys. Chem. B 100, 17732 (1996).
20. H. Graoui, S. Giorgio, and C. R. Henry, Surf. Sci. 417, 350 (1998).
21. X. Lai, T. P. St. Clair, and D. W. Goodman, Faraday Discuss. 114, 279 (1999).
22. K. H. Hansen, Z. Sljivancanin, E. Laegsgaard, F. Besenbacher, and I. Stensgaard, Surf. Sci. 505, 25 (2002).
23. G. A. Somorjai and K. McCrea, Appl. Catal., A 222, 3 (2001).
24. G. Rupprechter, H. Unterhalt, M. Morkel, P. Galletto, L. J. Hu, and H.-J. Freund, Surf. Sci. 502, 109 (2002).
25. E. Ozensoy, C. Hess, and D. W. Goodman, J. Am. Chem. Soc. 124, 8524 (2002).
26. P. L. Gai, Top. Catal. 8, 97 (1999).
27. H. Poppa, Top. Catal. 13, 139 (2000).
28. P. L. Hansen, J. B. Wagner, S. Helveg, J. R. Rostrup-Nielsen, B. S. Clausen, and H. Topsoe, Science 295, 2053 (2002); T. W. Hansen, J. B. Wagner, P. L. Hansen, S. Dahl, H. Topsoe, and C. J. H. Jacobsen, ibid. 294, 1508 (2001).
29. P. L. Hansen, J. B. Wagner, S. Helveg, J. R. Rostrup-Nielsen, B. S. Clausen, and H. Topsoe, Science 295, 2053 (2002); T. W. Hansen, J. B. Wagner, P. L. Hansen, S. Dahl, H. Topsoe, and C. J. H. Jacobsen, ibid. 294, 1508 (2001).
30. R. Sonnenfeld and P. K. Hansma, Science 232, 211 (1986); A. J. Bard and F.-R. F. Fan, in Scanning Tunneling Microscopy and Spectroscopy, edited by D. Bonnell (VCH, New York, 1993), p. 287; M. Wilms, M. Kruft, G. Bermes, and K. Wandelt, Rev. Sci, Instrum. 70, 3641 (1999).
31. R. Sonnenfeld and P. K. Hansma, Science 232, 211 (1986); A. J. Bard and F.-R. F. Fan, in Scanning Tunneling Microscopy and Spectroscopy, edited by D. Bonnell (VCH, New York, 1993), p. 287; M. Wilms, M. Kruft, G. Bermes, and K. Wandelt, Rev. Sci, Instrum. 70, 3641 (1999).
32. R. Sonnenfeld and P. K. Hansma, Science 232, 211 (1986); A. J. Bard and F.-R. F. Fan, in Scanning Tunneling Microscopy and Spectroscopy, edited by D. Bonnell (VCH, New York, 1993), p. 287; M. Wilms, M. Kruft, G. Bermes, and K. Wandelt, Rev. Sci, Instrum. 70, 3641 (1999).
33. K. Terashima, Y. Taniguchi, N. Yamaguchi, Y. Takamura, and T. Yoshida, Thin Solid Films 345, 146 (1999).
34. G. A. Somorjai, Appl. Surf. Sci. 121/122, 1 (1997).
35. L. Österlund, P. B. Rasmussen, P. Thostrup, E. Læsgaard, I. Stensgaard, and F. Besenbacher, Phys. Rev. Lett. 86, 460 (2001).
36. A. Kolmakov and D. W. Goodman, Catal. Lett. 70, 93 (2000).
37. B. J. McIntyre, M. Salmeron, and G. A. Somorjai, Rev. Sci. Instrum. 64, 687 (1993).
38. E. Laegsgaard, L. Osterlund, P. Thostrup, P. B. Rasmussen, I, Stensgaard, and F. Besenbacher, Rev, Sci. Instrum. 72, 3537 (2001).
39. G. Lengel, RHK technical report (http://www.rhk-tech.com/briefs/lowcurrent/index.html).
40. B. Voigtländer, A. Zinner, and T. Weber, Rev. Sci. Instrum. 67, 2568 (1996); B. Voigtländer, Habilition thesis, Jülich, 2000.
41. B. Voigtländer, A. Zinner, and T. Weber, Rev. Sci. Instrum. 67, 2568 (1996); B. Voigtländer, Habilition thesis, Jülich, 2000.
42. D. E. Jesson, M. Kastner, and B. Voigtländer, Phys. Rev. Lett. 84, 330 (2000).
43. B. Voigtländer and M. Kastner, J. Vac. Sci. Technol. B 17, 294 (1999).
44. B. Voigtländer and M. Kastner, Surf. Sci. 464, 131 (2000).
45. When the investigated phenomenon is impurity sensitive it is absolutely necessary to use a thoroughly outgassed UHV gas manifold system and purified gases when performing high pressure studies. For example, at 103 Pa of gas with an impurity at the parts per billion level, the time for the accumulation of one monolayer of the impurity is on the order of 103 s assuming a unity sticking probability. It is also advisable to coat the interior of the gas manifold system and STM chamber with gold to avoid reaction with reactive impurities present in the chamber walls [see E. Laegsgaard, L. Osterlund, P. Thastrup, P. B. Rasmussen, I. Stensgaard, and F. Besenbacher Rev. Sci. Instrum. 72, 3537 (2002)].
46. K. Bisocke, Surf. Sci. 181, 145 (1987).
47. U. Diebold, J. Lehman, T. Mahmoud, M. Kuhn, G. Leonardelli, W. Hebenstreit, M. Schmid, and P. Varga, Surf. Sci. 411, 137 (1998).
48. A. Kolmakov and D. W. Goodman, Chem. Rev. 2, 446 (2002).
49. A. Kolmakov and D. W. Goodman, Surf. Sci. 490, L597 (2001).
50. Electrical Breakdown of Gases, edited by J. M. Meek and J. D. Craggs (Wiley, Chichester, 1978).
51. E. S. Snow and P. M. Campbell, Science 270, 1639 (1995).
52. A. Ivanisevic and C. A. Mirkin, J. Am. Chem. Soc. 123, 7887 (2001).
53. A. Kolmakov and D. W. Goodman (unpublished).