The effect of annealing temperature on the structure and dielectric properties of (Ba0.6Sr0.4)TiO3 thin films

IEEE International Symposium on Applications of Ferroelectrics

Volumn , Issue , 2002, Pages 211-214

  Wu, Wenbiao ^a   Peng, Dongwen ^a   Liang, Xiaofeng ^a   Meng, Zhongyan ^a  

^a SHANGHAI UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

AGGLOMERATION; ANNEALING; ATOMIC FORCE MICROSCOPY; BARIUM COMPOUNDS; DIELECTRIC PROPERTIES; SCANNING ELECTRON MICROSCOPY; SOL-GELS; SUBSTRATES; SURFACE ROUGHNESS; THERMAL EFFECTS; X RAY DIFFRACTION ANALYSIS;

TUNABILITY;

THIN FILMS;

EID: 0038341703     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)

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8. H.N. Al-shareef,et al, "tunability and Calculation of the Dielectric Constant of Capacitor Structures with Interdigital Electrods," J. Electroceram. 1:2, pp.145-153, Jun 1997.