Powerful microfocus x-ray and hard x-ray 1 MA x-pinch plasma source for imaging, spectroscopy, backlighting, and polarimetry

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4502, Issue , 2001, Pages 62-73

  Kantsyrev, Victor L ^a   Bauer, B S ^a   Shlyaptseva, A S ^a   Fedin, D A ^a   Hansen, S ^a   Presura, R ^a   Fuelling, S ^a   Batie, S ^a   Oxner, A ^a   Faretto, H ^a   Ouart, N ^a   Keely, S ^a   LeBeau, H ^a   Chamberlain, D ^a  

^a UNIVERSITY OF NEVADA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANODES; ELECTRON BEAMS; PINCH EFFECT; PLASMA SOURCES; POLARIMETERS; TEMPERATURE MEASUREMENT; ULTRAVIOLET RADIATION; X RAY SPECTROSCOPY;

X-RAY EMISSIONS;

X RAYS;

EID: 0038331063     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.449868     Document Type: Conference Paper

References (16)

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