Extended backside-illuminated InGaAs on GaAs IR detectors

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4820, Issue 1, 2002, Pages 453-459

  John, Joachim ^a   Zimmermann, Lars ^a   Merken, Patrick ^a   Borghs, Gustaaf ^a   Van Hoof, Chris ^a   Nemeth, Stefan ^b  

^a IMEC   (Belgium)

^b XenICs   (Belgium)

Author keywords

Back side illumination; Extended InGaAs; Flip chip bonding; Focal plane array; Linear arra; SWIR

Indexed keywords

CRYSTAL LATTICES; MOLECULAR BEAM EPITAXY; PHOTOLITHOGRAPHY; PHOTOVOLTAIC EFFECTS; QUANTUM EFFICIENCY; SEMICONDUCTING INDIUM GALLIUM ARSENIDE; SUBSTRATES;

FLIP-CHIP BONDING;

INFRARED DETECTORS;

EID: 0038324491     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.450563     Document Type: Conference Paper

References (7)

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6. J. John, L. Zimmermann, Stefan Nemeth, Thierry Colin, Patrick Merken, Staf Borghs and Chris Van Hoof, "Extended InGaAs on GaAs Detectors for SWIR Linear Sensors", Proceedings of SPIE, Infrared Technology and Application XXVII, Aerosense, Orlando, 2001
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