STAIRS C - Production SXGA thermal imaging

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4820, Issue 1, 2002, Pages 469-478

  McDonald, John ^a   Crawford, Stewart ^a   Craig, Robert ^a   Glass, Adrian ^a   Dennis, Peter ^b   Wells, John ^c  

^a Laser Solutions Unit   (France)

^b QINETIQ   (United Kingdom)

^c BAE SYSTEMS   (United Kingdom)

Author keywords

Non Uniformity Correction; Peltier; Thermal Referencing

Indexed keywords

INFRARED DETECTORS; INFRARED RADIATION; OPTICAL RESOLVING POWER; PELTIER EFFECT;

THERMAL REFERENCING;

INFRARED IMAGING;

EID: 0038324487     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.451338     Document Type: Conference Paper

References (5)

1. th June 1999.
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3. T. Ashley Mat. Res. Soc. Symp. Proc. 484, 153 (1998).
4. "Large Area IR Negative Luminescent Devices", G. R. Nash, T. Ashley, N. T. Gordon, C. L. Jones, C. D. Maxey, and R. A. Catchpole, to be published in Proc. SPIE 4820 (2002).
5. "SXGA Resolution IR Sensor - STAIRS C", S. Crawford, J. McDonald, A. Glass, P Dennis, to be published in Proc. SPIE 4719 (2002)