Nondestructive determination of current-voltage characteristics of superconducting films by inductive critical current density measurements as a function of frequency

Applied Physics Letters

Volumn 82, Issue 19, 2003, Pages 3275-3277

  Yamasaki, Hirofumi ^a   Mawatari, Yasunori ^a   Nakagawa, Yoshihiko ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC FIELDS; FREQUENCIES; MAGNETIC FIELDS; MAGNETIZATION; MICROWAVE DEVICES; NONDESTRUCTIVE EXAMINATION;

THIRD-HARMONIC VOLTAGE;

SUPERCONDUCTING FILMS;

EID: 0038318828     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1571657     Document Type: Article

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