[N-(3-aminopropyl)-N-methyl-1,3-propanediamine-K 3N]dichlorocopper(II)

Acta Crystallographica Section C: Crystal Structure Communications

Volumn 54, Issue 12, 1998, Pages 1837-1839

  Mccasland, Anne K ^a   Alcock, Nathaniel W ^b   Busch, Daryle H ^a  

^a UNIVERSITY OF KANSAS   (United States)

^b UNIVERSITY OF WARWICK   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0038317578     PISSN: 01082701     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108270198009731     Document Type: Article

References (16)

1. Allen, F. H. & Kennard, O. (1993). Chem. Des. Autom. News, 8, 31-37.
2. Caira, M. R., Nassimbeni, L. R. & Woolley, P. R. (1975). Acta Cryst. B31, 1334-1337.
3. Cosier, J. & Glazer, A. M. (1986). J. Appl. Cryst. 19, 105-107.
4. Fletcher, D. A., McMeeking, R. F. & Parkin, D. (1996). J. Chem. Inf. Comput. Sci. 36, 746-749.
5. Huq, F. & Skapski, A. C. (1971). J. Chem. Soc. A, pp. 1927-1931.
6. Karn. J. L. & Busch, D. H. (1966). Nature (London), pp. 160-162.
7. Marsh, W. E., Hatfield, W. E. & Hodgson, D. J. (1988). Inorg. Chem. 27, 1819-1822.
8. Nelson, S. M., Knox, C. V., McCann, M. & Drew, M. G. B. (1981). J. Chem. Soc. Dalton Trans. pp. 1669-1677.
9. Orpen, A. G., Brammer, L., Allen, F. H., Kennard, O., Watson, D. G. & Taylor, R. (1989). J. Chem. Soc. Dalton Trans, pp. S1-83.
10. Prince, R. H., Stotter, D. A. & Woolley, P. R. (1974). Inorg. Chim. Acta, 9, 51-54.
11. Sheldrick, G. M. (1990). Acta Cryst. A46, 467-473.
12. Sheldrick, G. M. (1994). SHELXTL/PC. Version 5.0. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
13. Sheldrick, G. M. (1996a). SADABS. Program for Empirical Absorption Correction of Area Detector Data. University of Göttingen, Germany.
14. Sheldrick, G. M. (1996b). SHELXL96. Program for the Refinement of Crystal Structures. University of Göttingen, Germany.
15. Siemens (1994). SMART. Data Collection Software. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
16. Siemens (1995). SAINT. Data Integration Software. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.