-
1
-
-
0034732791
-
-
Devereux, M., McCann, M., Leon, V., Geraghty, M., McKee, V. & Wikaira, J. (2000). Polyhedron. 19, 1205-1211.
-
(2000)
Polyhedron.
, vol.19
, pp. 1205-1211
-
-
Devereux, M.1
McCann, M.2
Leon, V.3
Geraghty, M.4
McKee, V.5
Wikaira, J.6
-
2
-
-
0033659633
-
-
Filippova, Z. G., Kravtsov, V. Kh. & Gdanec, M. (2000). Russ. J. Coord. Chem. 26, 809-816.
-
(2000)
Russ. J. Coord. Chem.
, vol.26
, pp. 809-816
-
-
Filippova, Z.G.1
Kravtsov, V.Kh.2
Gdanec, M.3
-
3
-
-
0037185329
-
-
Li, L., Liao, D. & Jiang, Z. (2002). Inorg. Chem. 41, 421-424.
-
(2002)
Inorg. Chem.
, vol.41
, pp. 421-424
-
-
Li, L.1
Liao, D.2
Jiang, Z.3
-
4
-
-
0002763765
-
-
Li, J., Zeng, H., Chen, J., Wang, Q. & Wu, X. (1997). Chem. Commun. pp. 1213-1214.
-
(1997)
Chem. Commun.
, pp. 1213-1214
-
-
Li, J.1
Zeng, H.2
Chen, J.3
Wang, Q.4
Wu, X.5
-
7
-
-
0001869985
-
-
McCann, S., McCann, M., Casey, M. T., Jackman, M., Devereux, M. & McKee, V. (1998). Inorg. Chim. Acta, 279, 24-29.
-
(1998)
Inorg. Chim. Acta
, vol.279
, pp. 24-29
-
-
McCann, S.1
McCann, M.2
Casey, M.T.3
Jackman, M.4
Devereux, M.5
McKee, V.6
-
8
-
-
0002810213
-
-
Muro, I. G. de, Insausti, M., Lezama, L., Urtiaga, M. K., Arriortua, M. I. & Rojo, T. (2000). J. Chem. Soc. Dalton Trans. pp. 3360-3364.
-
(2000)
J. Chem. Soc. Dalton Trans.
, pp. 3360-3364
-
-
Muro, I.G.1
De Insausti, M.2
Lezama, L.3
Urtiaga, M.K.4
Arriortua, M.I.5
Rojo, T.6
-
9
-
-
84980089549
-
-
North, A. C. T., Phillips, D. C. & Mathews, F. S. (1968). Acta Cryst. A24, 351-359.
-
(1968)
Acta Cryst.
, vol.A24
, pp. 351-359
-
-
North, A.C.T.1
Phillips, D.C.2
Mathews, F.S.3
-
10
-
-
0034651447
-
-
Ruiz-Perez, C., Sanchiz, J., Hernandez-Molina, M., Lloret, F. & Juive, M. (2000). Inorg. Chim. Acta, 298, 202-208.
-
(2000)
Inorg. Chim. Acta
, vol.298
, pp. 202-208
-
-
Ruiz-Perez, C.1
Sanchiz, J.2
Hernandez-Molina, M.3
Lloret, F.4
Juive, M.5
-
11
-
-
0004150157
-
-
Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA
-
Sheldrick, G. M. (1990a). SHELXTL-Plus. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
-
(1990)
SHELXTL-Plus
-
-
Sheldrick, G.M.1
-
14
-
-
0034189928
-
-
Shi, Z., Zhang, L., Gao, S., Yang, G., Hua, J., Gao, L. & Feng, S. (2000). Inorg. Chem. 39, 1990-1993.
-
(2000)
Inorg. Chem.
, vol.39
, pp. 1990-1993
-
-
Shi, Z.1
Zhang, L.2
Gao, S.3
Yang, G.4
Hua, J.5
Gao, L.6
Feng, S.7
-
15
-
-
0003409324
-
-
Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA
-
Siemens (1991). XSCANS User's Manual. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
-
(1991)
XSCANS User's Manual
-
-
-
16
-
-
23044518551
-
-
Wang, Z., Zhou, X., Yu, W. & Fu, Y. (2000). Z. Kristallogr. 215, 423-424.
-
(2000)
Z. Kristallogr.
, vol.215
, pp. 423-424
-
-
Wang, Z.1
Zhou, X.2
Yu, W.3
Fu, Y.4
-
17
-
-
0000353367
-
-
Wei, Y., Zhang, S., Shao, M., Liu, Q. & Tang, Y. (1996). Polyhedron, pp. 4303-4305.
-
(1996)
Polyhedron
, pp. 4303-4305
-
-
Wei, Y.1
Zhang, S.2
Shao, M.3
Liu, Q.4
Tang, Y.5
|