The development of hard-X-ray optics at MSFC

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4851, Issue 1, 2002, Pages 631-638

  Ramsey, Brian ^a   Elsner, Ron ^a   Engelhaupt, Darell ^b   O'Dell, Steve ^a   Speegle, Chet ^c   Weiskopf, Martin ^a  

^a NASA MARSHALL SPACE FLIGHT CENTER   (United States)

^b UNIVERSITY OF ALABAMA IN HUNTSVILLE   (United States)

^c NONE

Author keywords

Electroform nickel replication; Grazing incidence optics; X ray astronomy; X ray imaging

Indexed keywords

ASTRONOMY; ELECTROFORMING; GRADIENT INDEX OPTICS; IMAGING SYSTEMS; NICKEL; SURFACES;

X-RAY IMAGING;

X RAY OPTICS;

EID: 0038294734     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.461597     Document Type: Conference Paper

References (6)

1. http://heasarc.gsfc.nasa.gov/docs/einstein/heao2_about.html
2. http://chandra.harvard.edu/
3. http://sci.esa.int/xmm/
4. D.Engelhaupt, B.D.Ramsey, S.L.O'Dell, W.Jones and K.Russell, SPIE 4138, pp. 154-163, 2000.
5. B.D.Ramsey, C.D.Alexander, J.A.Apple, C.M.Benson, K.L.Dietz, R.F.Elsner, D.E.Engelhaupt, K.K.Ghosh, J.K.Kolodziejczak, S.L.O'Dell, C.O.Speegle, D.A.Swartz and M.C.Weisskopf, Astrophys J.568, 2002.
6. K.L.Dietz, B.D.Ramsey, C.D.Alexander, J.A.Apple, K.K.Ghosh and W.R.Swift, to appear in Opt. Eng. 41(10), October 2002.