X-ray imaging spectrometer (XIS) on board Astro-E2

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4851, Issue 2, 2002, Pages 1071-1079

  Dotani, Tadayasu ^a   Ozaki, Masanobu ^a   Murakami, Hiroshi ^a   Koyama, Katsuji ^b   Tsuru, Takeshi ^b   Matsumoto, Hironori ^b   Tsunemi, Hiroshi ^c   Hayashida, Kiyoshi ^c   Miyata, Emi ^c   Kitamoto, Shunji ^d   Awaki, Hisamitsu ^e   Bautz, Mark ^f   Doty, John ^f   Ricker, George ^f   Foster, Rick ^f   Prigozhin, Gregory ^f   Kissel, Steve ^f   Burke, Barry ^f   Pillsbury, Allen ^f  

^a JAPAN AEROSPACE EXPLORATION AGENCY   (Japan)

^b KYOTO UNIVERSITY   (Japan)

^c OSAKA UNIVERSITY   (Japan)

^d RIKKYO UNIVERSITY   (Japan)

^e EHIME UNIVERSITY   (Japan)

^f MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Astro E2; CCD; X ray; XIS

Indexed keywords

ASTRONOMICAL SATELLITES; CALIBRATION; OBSERVATORIES; OPTICAL TELESCOPES; RADIATION DAMAGE; RADIOISOTOPES; X RAY CAMERAS;

X-RAY TELESCOPES;

X RAY SPECTROMETERS;

EID: 0038294656     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.461313     Document Type: Conference Paper

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