Design of double CUSUM quality control schemes

European Journal of Operational Research

Volumn 95, Issue 3, 1996, Pages 641-648

  Waldmann, Karl Heinz ^a  

^a UNIVERSITY OF KARLSRUHE   (Germany)

Author keywords

Cumulative sum procedures; Extrapolation methods; Quality control; Run length distribution

Indexed keywords

EID: 0038280909     PISSN: 03772217     EISSN: None     Source Type: Journal    
DOI: 10.1016/0377-2217(95)00317-7     Document Type: Article

References (8)

1. Lucas, J.M., 1982. Combined Shewhart-CUSUM Quality Control schemes. Journal of Quality Technology, 14, 51-59.
2. Ross, S.M., 1983. Stochastic Processes, John Wiley, New York.
3. Rowlands, R.J., Nix, A.B.J., Abdollahian, M.A. and Kemp, K.W., 1982. Snub-nosed V-mask Control. The Statistican, 31, 133-142.
4. Ryan, T.P., 1989. Statistical Methods for Quality Improvement, John Wiley, New York.
5. Waldmann, K.-H., 1986a. Bounds for the Distribution of the Run Length of One-Sided and Two-Sided CUSUM-Quality Control Schemes. Technometrics, 28, 61-67.
6. Waldmann, K.-H., 1986b. Bounds to the distribution of the run length in general quality-control schemes. Statistische Hefte, 27, 37-56.
7. Waldmann, K.-H., 1993. Güteeigenschaften der Shewhart-Karte unter Einbeziehen von Ergänzungsregeln. Qualität und Zuverlässigkeit, 38, 575-580.
8. Wetherill, G.B. and Brown, D.W., 1991. Statistical Process Control. Theory and Practice, Chapman and Hall, London.