Crystal growth of nanosized zeolites in solutions and films: In situ grazing incidence diffraction (GID) study using synchrotron x-ray radiation

Journal of Materials Science Letters

Volumn 22, Issue 10, 2003, Pages 751-753

  Mintova, S ^a   Jean, B ^b   Metzger, T H ^b   Bein, T ^a  

^a UNIVERSITY OF MUNICH   (Germany)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

COLLOIDS; CRYSTAL GROWTH; GRAIN SIZE AND SHAPE; LIGHT SCATTERING; NANOSTRUCTURED MATERIALS; SOLUTIONS; SUBSTRATES; SURFACE ROUGHNESS; SUSPENSIONS (FLUIDS); SYNTHESIS (CHEMICAL); THIN FILMS; X RAY DIFFRACTION;

IN SITU GRAZING INCIDENCE DIFFRACTION; NANOSIZED ZEOLITE;

ZEOLITES;

EID: 0038271906     PISSN: 02618028     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1023760111702     Document Type: Article

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