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Volumn 90, Issue 19, 2003, Pages

Memory effects in amorphous solids below 20 mK

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; CAPACITANCE MEASUREMENT; DYNAMICS; ELECTRIC FIELD EFFECTS; PERMITTIVITY MEASUREMENT; THERMAL EFFECTS;

EID: 0038270764     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (23)

References (20)
  • 11
    • 0038506856 scopus 로고    scopus 로고
    • Ph.D. thesis, Stanford University
    • D. Rosenberg, Ph.D. thesis, Stanford University, 2003.
    • (2003)
    • Rosenberg, D.1
  • 13
    • 0037492964 scopus 로고    scopus 로고
    • BaOA12O3SiO2. Provided by Peter Strehlow, PTB, Berlin
    • BaOA12O3SiO2. Provided by Peter Strehlow, PTB, Berlin.
  • 14
    • 0037492963 scopus 로고    scopus 로고
    • BK7, Schott Corporation, Technical Glass Division Yonkers, NY
    • BK7, Schott Corporation, Technical Glass Division Yonkers, NY.
  • 15
    • 0038168190 scopus 로고    scopus 로고
    • Kapton polyimide film. DuPont Packaging and Industrial Polymers, Wilmington, DE
    • Kapton polyimide film. DuPont Packaging and Industrial Polymers, Wilmington, DE.
  • 16
    • 0037830482 scopus 로고    scopus 로고
    • Mylar packaging film. DuPont Packaging and Industrial Polymers, Wilmington, DE
    • Mylar packaging film. DuPont Packaging and Industrial Polymers, Wilmington, DE.
  • 17
    • 0038168189 scopus 로고    scopus 로고
    • Corning No. 1 microscope cover, part no. 2935-224. Corning Labware and Equipment, Corning, NY
    • Corning No. 1 microscope cover, part no. 2935-224. Corning Labware and Equipment, Corning, NY.
  • 18
    • 0037830483 scopus 로고    scopus 로고
    • (to be published)
    • P. Nalbach (to be published).
    • Nalbach, P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.