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Volumn 197, Issue 2, 2003, Pages 582-585

Fine tuning of the dichroic behavior of Bragg reflectors based on anisotropically nanostructured silicon

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC PROPERTIES; ELECTROCHEMISTRY; ETCHING; LIGHT POLARIZATION; NANOSTRUCTURED MATERIALS; OPTICAL PROPERTIES; OPTICAL VARIABLES MEASUREMENT; REFRACTIVE INDEX; SEMICONDUCTING SILICON;

EID: 0038270690     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/pssa.200306566     Document Type: Conference Paper
Times cited : (6)

References (9)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.