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Volumn 197, Issue 2, 2003, Pages 582-585
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Fine tuning of the dichroic behavior of Bragg reflectors based on anisotropically nanostructured silicon
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Author keywords
[No Author keywords available]
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Indexed keywords
DIELECTRIC PROPERTIES;
ELECTROCHEMISTRY;
ETCHING;
LIGHT POLARIZATION;
NANOSTRUCTURED MATERIALS;
OPTICAL PROPERTIES;
OPTICAL VARIABLES MEASUREMENT;
REFRACTIVE INDEX;
SEMICONDUCTING SILICON;
ANISOTROPICALLY NANOSTRUCTURED SILICON;
BRAGG REFLECTORS;
DICHROIC BEHAVIOR;
MIRRORS;
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EID: 0038270690
PISSN: 00318965
EISSN: None
Source Type: Journal
DOI: 10.1002/pssa.200306566 Document Type: Conference Paper |
Times cited : (6)
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References (9)
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