Weak developments and metrization

Topology and its Applications

Volumn 100, Issue 1, 2000, Pages 23-38

  Alleche, B ^a   Arhangel'skii A V ^b,c   Calbrix, J ^a  

^a UNIVERSITÉ DE ROUEN   (France)

^b MOSCOW STATE UNIVERSITY   (Russian Federation)

^c OHIO UNIVERSITY   (United States)

Author keywords

Base of countable order; Covering properties; Development; Metrization; Sharp base; Weak development; Weak k development

Indexed keywords

EID: 0038258410     PISSN: 0016660X     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0166-8641(98)00135-7     Document Type: Article

References (11)

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11. S.W. Davis, G.M. Reed and M.L. Wage, Further results on weakly uniform bases, Houston J. Math. 2 (1976) 57-63.