Microscopic identification of the origin of generation-recombination noise in hydrogenated amorphous silicon with noise-detected magnetic resonance

Physical Review Letters

Volumn 84, Issue 22, 2000, Pages 5188-5191

  Goennenwein, S T B ^a   Bayerl, M W ^a   Brandt, M S ^a   Stutzmann, M ^a  

^a WALTER SCHOTTKY INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0038257300     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.84.5188     Document Type: Article

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