Effect of short-circuiting on the oxidation kinetics of copper and its doped varieties in the temperature range of 523-1073 K

Oxidation of Metals

Volumn 46, Issue 1-2, 1996, Pages 73-107

  Bose, S K ^a   Mitra, S K ^b   Roy, S K ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY   (India)

^b NATIONAL INSTITUTE OF TECHNOLOGY   (India)

Author keywords

Copper; Cr doped copper; Li doped copper; Mott's parabola; Oxidation; Short circuiting; Wagner's parabola

Indexed keywords

EID: 0038245776     PISSN: 0030770X     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF01046885     Document Type: Article

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