Electrorefractive properties of modified five-layer asymmetric coupled quantum well (FACQW)

Microelectronics Journal

Volumn 34, Issue 5-8, 2003, Pages 387-390

  Arakawa, T ^a   Tada, K ^a   Iino, R ^a   Suzuki, T ^a   Noh, J H ^a   Haneji, N ^a   Feng, H ^b  

^a YOKOHAMA NATIONAL UNIVERSITY   (Japan)

^b FUJITSU LABORATORIES OF AMERICA   (United States)

Author keywords

Electrorefractive index change; Five layer asymmetric coupled quantum well; Thickness fluctuation

Indexed keywords

BINDING ENERGY; EXCITONS; GROUND STATE; MODULATORS; OPTICAL WAVEGUIDES; REFRACTIVE INDEX;

QUANTUM CONFINED STARK EFFECT (QCSE);

SEMICONDUCTOR QUANTUM WELLS;

EID: 0038242822     PISSN: 00262692     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2692(03)00031-4     Document Type: Conference Paper

References (6)

1. Susa N. Electric-field-induced refractive index changes in three-step asymmetric coupled quantum well. J. Appl. Phys. 73:(12):1993;8463-8470.
2. Feng H., Pang J.P., Sugiyama M., Tada K., Nakano Y. Field-induced optical effect in a five-step asymmetric coupled quantum well with modified potential. IEEE J. Quantum Electron. 34:(7):1998;1197-1208.
3. Arakawa T., Tada K., Kurosawa N., Noh J.-H. Anomalous sharp dip of large field induced refractive index change in GaAs/AlGaAs five-layer asymmetric coupled quantum well. Jpn. J. Appl. Phys. 39:(11):2000;6329-6333.
4. Tada K., Arakawa T., Kazuma K., Kurosawa N., Noh J.-H. Influence of one monolayer thickness variation in GaAs/AlGaAs five-layer asymmetric coupled quantum well upon electrorefractive index change. Jpn. J. Appl. Phys. 40:(2A):2001;656-661.
5. Suzuki T., Noh J.-H., Arakawa T., Tada K., Okamiya Y., Miyagi Y., Sakai N., Haneji N. Fabrication and optical characterization of five-layer asymmetric coupled quantum well (FACQW). Jpn. J. Appl. Phys. 41:(4B):2002;2701-2706.
6. Arakawa T., Feng H., Tada K., Iino R., Kazuma K., Noh J.-H. Technical Digest of Fourth Pacific Rim Conference on Lasers and Electro-Optics (CLEO PR 2001) (July 2001, Chiba, Japan). Technical Digest of Fourth Pacific Rim Conference on Lasers and Electro-Optics (CLEO PR 2001) (July 2001, Chiba, Japan). vol. 2:2001;. pp. 232-233.