Accurate spectral characterization of polarization-dependent loss

Journal of Lightwave Technology

Volumn 21, Issue 2, 2003, Pages 432-437

  Craig, R M ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Low coherence; Mueller matrix; Polarization dependent loss (PDL); Wavelength dependence

Indexed keywords

BIREFRINGENCE; DENSE WAVELENGTH DIVISION MULTIPLEXING; OPTICAL COMMUNICATION; SPECTRUM ANALYZERS;

FRESNEL REFERENCE; HYDROGEN CYANIDE REFERENCE; MUELLER-MATRIX; POLARIZATION-DEPENDENT LOSS;

LIGHT POLARIZATION;

EID: 0038242109     PISSN: 07338724     EISSN: None     Source Type: Journal    
DOI: 10.1109/JLT.2003.808761     Document Type: Article

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