Size dependence of the 2p-level shift of nanosolid silicon

Journal of Physical Chemistry B

Volumn 107, Issue 22, 2003, Pages 5113-5115

  Sun, Chang Q ^a   Pan, L K ^a   Fu, Y Q ^a   Tay, B K ^a   Li, S ^a  

^a NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC TRAPPING ENERGY;

ENERGY GAP; MATHEMATICAL MODELS; NANOSTRUCTURED MATERIALS; PARTICLE SIZE ANALYSIS; PHOTOLUMINESCENCE; X RAY PHOTOELECTRON SPECTROSCOPY;

SEMICONDUCTING SILICON;

EID: 0038240637     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (14)

1. Pan, L. K.; Sun, C. Q.; Tay, B. K.; Chen, T. P.; Li, S. J. Phys. Chem. B 2002, 106, 11725.
2. Veprek, S.; Argon, A. S. J. Vac. Sci. Technol. B 2002, 20, 650.
3. Sun, C. Q.; Tay, B. K.; Fu, Y. Q.; Li, S.; Chen, T. P.; Bai, H. L.; Jiang, E. Y. J. Phys. Chem. B 2003, 707, 411.
4. Borgohain, K.; Singh, J. B.; Rao, M. V. R.; Shripathi, T.; Mahamuni, S. Phys. Rev. B 2000, 61, 11093.
5. Yang, D. Q.; Sacher E. Appl. Surf. Sci. 2002, 195, 187.
6. Ohgi, T.; Fujita, D. Phys. Rev. B 2002, 66, 115410.
7. Schmeisser, D.; Böhme, O.; Yafantis, A.; Heller, T.; Batoherlor, D. R.; Lundstrom, I.; Spetz, A. L. Phys. Rev. Lett. 1999, 83, 380.
8. Aldén, M.; Skriver, H. L.; Johansson, B. Phys. Rev. Lett. 1993, 71, 2449.
9. Navas, E. Starke, K.; Laubschat, C.; Weschke, E.; Kaindl, G. Phys. Rev. B 1993, 48, 14753.
10. Phillips, W. D. Rev. Mod. Phys. 1998, 70, 721.
11. Sun, C. Q.; Tay, B. K.; Zeng, X. T.; Li, S.; Chen, T. P.; Zhou, J.; Bai, H. L.; Jiang, E. Y. J. Phys. Condens. Mater. 2002, 14, 7781.
12. Schuppler, S.; Friedman, S. L.; Marcus, M. A.; Adler, D. L.; Xie, Y. H.; Ross, F. M.; Chabal, Y. J.; Harris, T. D.; Brus, L. E.; Brown, W. L.; Chaban E. E.; Szajowski, P. F.; Christman, S. B.; Citrin, P. H. Phys. Rev. B 1995, 52, 4910.
13. Mason, M. G. Phys. Rev. B 1983, 27, 748.
14. Sun, C. Q.; Pan, Li. K. Size-enhanced Stokes shift between photoabsorption and photoemission of nanosolid silicon. Submitted to Appl. Phys. Lett.