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Volumn 57, Issue 20, 2003, Pages 3057-3062
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Measurement of microscopic stress distribution of multilayered composite by X-ray stress analysis
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Author keywords
Ceramics; Multilayer structure; Nanocomposite; Residual stress; Stress distribution; X ray techniques
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Indexed keywords
COMPRESSIVE STRESS;
MULTILAYERS;
NANOSTRUCTURED MATERIALS;
STRESS CONCENTRATION;
X RAY DIFFRACTION ANALYSIS;
ZIRCONIA;
MULTILAYERED COMPOSITES;
COMPOSITE MATERIALS;
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EID: 0038237677
PISSN: 0167577X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0167-577X(02)01436-2 Document Type: Article |
Times cited : (16)
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References (12)
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