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Volumn 57, Issue 20, 2003, Pages 3057-3062

Measurement of microscopic stress distribution of multilayered composite by X-ray stress analysis

Author keywords

Ceramics; Multilayer structure; Nanocomposite; Residual stress; Stress distribution; X ray techniques

Indexed keywords

COMPRESSIVE STRESS; MULTILAYERS; NANOSTRUCTURED MATERIALS; STRESS CONCENTRATION; X RAY DIFFRACTION ANALYSIS; ZIRCONIA;

EID: 0038237677     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-577X(02)01436-2     Document Type: Article
Times cited : (16)

References (12)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.