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Volumn 48, Issue 12, 2003, Pages 1665-1674

Electrochemically grown passive films on carbon steel (SAE 1018) in alkaline sour medium

Author keywords

Alkaline sour media; Carbon steel; Corrosion; EIS; Iron sulfide film; SEM; SPECM; XPS

Indexed keywords

CARBON STEEL; CHEMICAL REACTIONS; DIFFUSION; FILM GROWTH; INTERFACES (MATERIALS); METALLIC FILMS; SCANNING ELECTRON MICROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0038217096     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0013-4686(03)00145-2     Document Type: Article
Times cited : (50)

References (38)
  • 13
    • 0037626542 scopus 로고    scopus 로고
    • Passivity of metals and semiconductors
    • M.B. Ives, J.L. Luo, J.R. Rodda (Eds.)
    • G. Frankel, Passivity of metals and semiconductors, in: M.B. Ives, J.L. Luo, J.R. Rodda (Eds.), Proceedings of the Eighth International Symposium of ISE, Vols. 42-99, 2001, p. 445.
    • (2001) Proceedings of the Eighth International Symposium of ISE , vol.42 , Issue.99 , pp. 445
    • Frankel, G.1
  • 15
    • 4243246117 scopus 로고    scopus 로고
    • M.Sc. Thesis, Universidad de Guadalajara Press, Guadalajara, Mexico
    • F.R. Hernández, M.Sc. Thesis, Universidad de Guadalajara Press, Guadalajara, Mexico, 2001.
    • (2001)
    • Hernández, F.R.1
  • 24
    • 0038640955 scopus 로고    scopus 로고
    • Ph.D. Thesis, Universidad Autónoma Metropolitana, Iztapalapa, Mexico
    • E. Sosa, Ph.D. Thesis, Universidad Autónoma Metropolitana, Iztapalapa, Mexico, 2002.
    • (2002)
    • Sosa, E.1
  • 28
    • 0037626540 scopus 로고    scopus 로고
    • Passivity of metals and semiconductors
    • M.B. Ives, J.L. Luo, J.R. Rodda (Eds.)
    • R.W. Stachle, Z. Fang, Passivity of metals and semiconductors, in: M.B. Ives, J.L. Luo, J.R. Rodda (Eds.), Proceedings of the Eighth International Symposium of ISE, Vols. 42-99, 2001, p. 299.
    • (2001) Proceedings of the Eighth International Symposium of ISE , vol.42 , Issue.99 , pp. 299
    • Stachle, R.W.1    Fang, Z.2
  • 29
    • 84870956972 scopus 로고    scopus 로고
    • NIST XPS database. http://www.srdata.nist.gov/xps/spectrum.htm.
    • NIST XPS Database


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.