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Volumn 41, Issue 2, 2003, Pages 133-144

Comparison of X-ray line profile and dip test measurements of internal stresses during high temperature creep of copper;Porovnání vnitřních napětí při vysokoteplotním creepu mědi měřených rentgenograficky a technikou změn napětí

Author keywords

Composite model; Creep; Dip test; Internal stress; X ray diffraction profiles

Indexed keywords

CREEP; HIGH TEMPERATURE EFFECTS; RESIDUAL STRESSES; STRAIN RATE; X RAY DIFFRACTION ANALYSIS;

EID: 0038215624     PISSN: 0023432X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (2)

References (20)
  • 15
    • 0002902333 scopus 로고
    • Eds.: Rosenfield, A. R., Hahan, G. T., Bement, A. L., Jaffee, R. I. New York, McGraw-Hill
    • LI, J. C. M.: In: Dislocation Dynamics. Eds.: Rosenfield, A. R., Hahan, G. T., Bement, A. L., Jaffee, R. I. New York, McGraw-Hill 1968, p. 87.
    • (1968) Dislocation Dynamics , pp. 87
    • Li, J.C.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.