Noise averaging and measurement resolution (or "A little noise is a good thing")

Review of Scientific Instruments

Volumn 70, Issue 4, 1999, Pages 2038-2040

  Potzick, James ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0038210108     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1149735     Document Type: Article

References (4)

1. I. H. Lira and W. Wöger, Meas. Sci. Technol. 8, 441 (1997).
2. International Vocabulary of Basic and General Terms in Metrology, 2nd ed. (International Organization for Standardization, Geneva, 1993).
3. Guide to the Expression of Uncertainty in Measurement, 1st ed. (International Organization for Standardization, Geneva, 1993).
4. J. Potzick, Antireflecting-Chromium Linewidth Standard, SRM 473, for Calibration of Optical Microscope Linewidth Measuring Systems, NIST Special Publication No. SP-260-129 (1997).