Analysis of the Fresnel field of a double diffraction system in the case of two amplitude diffraction gratings under partially coherent illumination

Optical Engineering

Volumn 36, Issue 8, 1997, Pages 2149-2157

  Olszak, Artur ^a,b   Wronkowski, Leszek ^b,c  

^a SPIE   (Poland)

^b WARSAW UNIVERSITY OF TECHNOLOGY   (Poland)

^c Ctr for Metrol and Measuring Syst

Author keywords

Diffraction gratings; Fresnel diffraction; Moir phenomenon; Optoelectronic transducers

Indexed keywords

EID: 0038204646     PISSN: 00913286     EISSN: None     Source Type: Journal    
DOI: 10.1117/1.601433     Document Type: Article

References (22)

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