Grazing incidence small-angle X-ray scattering studies of the synthesis and growth of CdS quantum dots from constituent atoms in SiO2 matrix

Journal of Applied Crystallography

Volumn 36, Issue 3 I, 2003, Pages 443-446

  Desnica, U V ^a   Dubcek, P ^a   Desnica Frankovic, I D ^a   Buljan, M ^a   Bernstorff, S ^b   White, C W ^c  

^a RUDER BO KOVI INSTITUTE   (Croatia)

^b SINCROTRONE TRIESTE   (Italy)

^c OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

CdS; GISAXS; Implantation; Nanocrystals; Quantum dots; SAXS; X ray scattering

Indexed keywords

CADMIUM; SILICON DIOXIDE; SULFUR;

CONFERENCE PAPER; CRYSTAL STRUCTURE; CRYSTALLIZATION; DYNAMICS; GRAZING INCIDENCE SMALL ANGLE X RAY SCATTERING; IMPLANTATION; LOW TEMPERATURE PROCEDURES; NANOPARTICLE; QUANTUM DOT; SYNTHESIS; X RAY CRYSTALLOGRAPHY;

EID: 0038204207     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889803000529     Document Type: Conference Paper

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