Experimental elucidation: Microscopic mechanism of resonant X-ray scattering in manganite films

Journal of the Physical Society of Japan

Volumn 72, Issue 5, 2003, Pages 1006-1009

  Ohsumi, Hiroyuki ^a,j   Murakami, Yoichi ^a,b,c,k   Kiyama, Takashi ^d,l   Nakao, Hironori ^a,b,k   Kubota, Masato ^a,b   Wakabayashi, Yusuke ^a,e   Konishi, Yoshinori ^f,m   Izumi, Makoto ^f,n   Kawasaki, Masashi ^g,h,o   Tokura, Yoshinori ^g,i  

^a INSTITUTE OF MATERIALS STRUCTURE SCIENCE   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c JAPAN ATOMIC ENERGY AGENCY   (Japan)

^d CHIBA UNIVERSITY   (Japan)

^e KEIO UNIVERSITY   (Japan)

^f JT RES CENTER FOR ATOM TECHNOLOGY   (Japan)

^g NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^h TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

ⁱ UNIVERSITY OF TOKYO   (Japan)

^j JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

^k TOHOKU UNIVERSITY   (Japan)

^l NAGOYA UNIVERSITY   (Japan)

^m FUJI ELECTRIC CO   (Japan)

ⁿ UNIVERSITY OF TOKYO   (Japan)

^o TOHOKU UNIVERSITY   (Japan)

more..

Author keywords

Epitaxial strain; Manganite; Orbital ordering; Resonant X ray scattering; Thin film

Indexed keywords

MANGANESE; MANGANITE; PEROVSKITE; UNCLASSIFIED DRUG;

ANISOTROPY; ARTICLE; ELECTRON; ENERGY; FILM; MICROSCOPY; RADIATION SCATTERING; SIGNAL DETECTION; STRUCTURE ANALYSIS;

EID: 0038201025     PISSN: 00319015     EISSN: None     Source Type: Journal    
DOI: 10.1143/JPSJ.72.1006     Document Type: Article

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