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Volumn 41, Issue 1, 1992, Pages 3-49

Atomic force microscopy

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0038196357     PISSN: 00796816     EISSN: None     Source Type: Journal    
DOI: 10.1016/0079-6816(92)90009-7     Document Type: Article
Times cited : (206)

References (129)
  • 5
    • 0024286273 scopus 로고
    • Scanning tunneling microscopy and atomic force microscopy: application to biology and technology
    • For earlier reviews see e.g.
    • (1988) Science , vol.242 , pp. 157
    • Hansma1    Elings2    Marti3    Bracker4
  • 34
    • 3643141042 scopus 로고
    • Effect of carbon concentration on the thermal conversion of liquid-encapsulated Czochralski semi-insulating GaAs
    • (1988) Applied Physics Letters , vol.53 , pp. 1054
    • Meyer1    Amer2
  • 107
    • 84915410742 scopus 로고    scopus 로고
    • R. Overney and E. Meyer (unpublished work).
  • 118
    • 84915410739 scopus 로고    scopus 로고
    • D. Anselmetti (private communication).
  • 121
    • 84915410738 scopus 로고    scopus 로고
    • T.P. Weihs, Z. Nawaz, S.P. Jarvis and J.B. Pethica, (in press).
  • 123
    • 84915410737 scopus 로고    scopus 로고
    • H.J. Mamin, H. Birk and D. Rugar, (in press).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.