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Volumn 41, Issue 1, 1992, Pages 3-49
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Atomic force microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0038196357
PISSN: 00796816
EISSN: None
Source Type: Journal
DOI: 10.1016/0079-6816(92)90009-7 Document Type: Article |
Times cited : (206)
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References (129)
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