A simple test for high Jc and low Rs superconducting thin films

Superconductor Science and Technology

Volumn 16, Issue 5, 2003, Pages

  Sundaresan, A ^a,b   Tanaka, Y ^a,b   Iyo, A ^a,b   Kusunoki, M ^c   Ohshima, S ^c  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c YAMAGATA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); HIGH TEMPERATURE SUPERCONDUCTORS; HIGH TEMPERATURE TESTING; PERMANENT MAGNETS; THIN FILMS;

HIGH FLUX PINNING EFFECT; SUPERCONDUCTING THIN FILM TESTING;

SUPERCONDUCTING FILMS;

EID: 0038188735     PISSN: 09532048     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-2048/16/5/102     Document Type: Article

References (8)

1. Hellman F, Gyorgy E M, Johnson D W Jr, O'Bryan H M and Sherwook R C 1988 J. Appl. Phys. 63 447
2. Peters P N, Sisk R C, Urban E W, Huang C Y and Wu M K 1988 Appl. Phys. Lett. 52 2066
3. Sundaresan A, Crisan A, Nie J C, Hirai M, Asada H, Kito H, Tanaka Y and Ihara H 2002 Supercond. Sci. Technol. 15 960
4. Ohshima S, Oikawa S, Noguchi T, Inadomaru M, Kusunoki M, Mukaida M, Yamasaki H and Nakagawa Y 2002 Physica C 372-376 671
5. Crisan A, Fjuiwara S, Nie J C, Sundaresan A and Ihara H 2001 Appl. Phys. Lett. 79 4547
6. Sundaresan A, Asada H, Kito H, Tanaka Y, Iyo A, Kusunoki M and Oshima S (to be submitted)
7. Kusunoki M, Inadomaru M, Ohshima S, Aizawa K, Mukaida M, Lorenz M and Hochmuth H 2002 Physica C 377 313
8. Okai D, Kusunoki M, Mukaida M and Ohshima S 2001 IEEE Trans. Appl. Supercond. 11 48