Experimental characterization of operational amplifiers: A system identification approach

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn 1, Issue , 2003, Pages 362-367

  Pintelon, R ^a   Vandersteen, G ^b   Rolain, Y ^a  

^a VRIJE UNIVERSITEIT BRUSSEL   (Belgium)

^b IMEC   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC IMPEDANCE; GAUSSIAN NOISE (ELECTRONIC); MAXIMUM LIKELIHOOD ESTIMATION; NONLINEAR DISTORTION; AMPLIFIERS (ELECTRONIC); ANALOG INTEGRATED CIRCUITS; DISTORTION (WAVES); ELECTRIC POWER MEASUREMENT; GAIN MEASUREMENT; IDENTIFICATION (CONTROL SYSTEMS); POWER SUPPLY CIRCUITS; RELIGIOUS BUILDINGS; UNCERTAINTY ANALYSIS;

UNMODELLED DYNAMICS;

OPERATIONAL AMPLIFIERS;

DISTORTION MEASUREMENT; FREQUENCY MEASUREMENTS; MEASUREMENT UNCERTAINTY; NOISE MEASUREMENTS; POWER SUPPLY;

EID: 0038169922     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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