Vector diffraction from subwavelength optical disk structures: Two-dimensional near-field profiles

Optics Express

Volumn 2, Issue 5, 1998, Pages 191-197

  Liu, Wei Chih ^a   Kowarz, Marek W ^b  

^a UNIVERSITY OF ROCHESTER   (United States)

^b EASTMAN KODAK COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS; ELECTRIC FIELD EFFECTS; ELECTROMAGNETIC FIELD EFFECTS; FINITE DIFFERENCE METHOD; FREQUENCY DOMAIN ANALYSIS; LIGHT POLARIZATION; MAXWELL EQUATIONS; OPTICAL DISK STORAGE; ROM; VIDEODISKS;

HELMHOLTZ EQUATIONS; LASER WAVELENGTH; METALLIC STRUCTURES; VECTOR DIFFRACTION;

DIFFRACTION;

EID: 0038163978     PISSN: 10944087     EISSN: None     Source Type: Journal    
DOI: 10.1364/OE.2.000191     Document Type: Article

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