Changes in particle area measurements due to SEM accelerating voltage and magnification

Microscopy Research and Technique

Volumn 61, Issue 5, 2003, Pages 463-468

  Yañez, María Julia ^b   Barbosa, Silvia Elena ^a  

^a PLAPIQUI UNS CONICET   (Argentina)

^b NONE

Author keywords

Area calculations affected by accelerating voltage and magnifications; Artifacts; kV effects; Scanning electron microscopy

Indexed keywords

GEODESY; IMAGE ACQUISITION; IMAGE ANALYSIS; PARTICLE SIZE; PARTICLE SIZE ANALYSIS; POLYMER BLENDS; SURVEYING;

ACCELERATING VOLTAGES; AREA CALCULATION; AREA CALCULATION AFFECTED BY ACCELERATING VOLTAGE AND MAGNIFICATION; AREA MEASUREMENT; ARTIFACT; IMAGE ANALYSIS SOFTWARE; KV EFFECT; LINE IMAGES; PARTICLES SIZES; SCANNING ELECTRON MICROSCOPY IMAGE;

SCANNING ELECTRON MICROSCOPY;

ACCELERATION; ANALYTICAL ERROR; ARTICLE; CALIBRATION; COMPUTER PROGRAM; ELECTRON; IMAGE ANALYSIS; MEASUREMENT; POTENTIAL DIFFERENCE; PRIORITY JOURNAL; SAMPLE; SCANNING ELECTRON MICROSCOPY;

EID: 0038163522     PISSN: 1059910X     EISSN: None     Source Type: Journal    
DOI: 10.1002/jemt.10309     Document Type: Article

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