Analysis of the Drude model in metallic films

Applied Optics

Volumn 40, Issue 34, 2001, Pages 6307-6311

  Li, H Y ^a   Zhou, S M ^a   Li, J ^a   Chen, Y L ^a   Wang, S Y ^a   Shen, Z C ^a   Chen, L Y ^a   Liu, H ^b   Zhang, X X ^b  

^a FUDAN UNIVERSITY   (China)

^b HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DIELECTRIC MATERIALS; ELLIPSOMETRY; POLARIZATION;

DRUDE MODEL;

METALLIC FILMS;

EID: 0038149656     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.40.006307     Document Type: Article

References (12)

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