Probabilistic model for sensor fault detection and identification

AIChE Journal

Volumn 49, Issue 7, 2003, Pages 1787-1802

  Mehranbod, Nasir ^a   Soroush, Masoud ^a   Piovoso, Michael ^b   Ogunnaike, Babatunde A ^c  

^a Drexel University   (United States)

^b PENNSYLVANIA STATE UNIVERSITY   (United States)

^c DUPONT COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL REACTORS; DATA REDUCTION; FAILURE ANALYSIS; POLYMERIZATION; PROBABILITY;

SENSOR FAULT DETECTION;

SENSORS;

FAULT DETECTION; SENSOR;

ARTICLE; BAYES THEOREM; MATHEMATICAL MODEL; POLYMERIZATION; PROBABILITY; REACTOR; SENSOR;

EID: 0038148305     PISSN: 00011541     EISSN: None     Source Type: Journal    
DOI: 10.1002/aic.690490716     Document Type: Article

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