Simultaneous determination of trace elements in minute samples by electrothermal-vaporization/low-pressure helium-ICP-MS

Analytical Sciences

Volumn 19, Issue 5, 2003, Pages 791-793

  Hayashi, Hideo ^a   Honda, Takahiro ^a   Iwata, Taku ^a   Tanaka, Tomokazu ^a   Hiraide, Masataka ^a  

^a NAGOYA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

HELIUM; INDUCTIVELY COUPLED PLASMA MASS SPECTROMETRY; MASS SPECTROMETERS; VAPORIZATION;

BACKGROUND SIGNALS; CERTIFIED REFERENCE MATERIALS; DETECTION LIMITS; ELECTROTHERMAL VAPORIZATION; HUMAN HAIR; LOW PRESSURES; SIMULTANEOUS DETERMINATIONS;

TRACE ELEMENTS;

ACCURACY; ANALYTIC METHOD; ARTICLE; DRUG DETERMINATION; ELECTROTHERMAL VAPORIZATION; HAIR ANALYSIS; LOW PRESSURE HELIUM INDUCTIVELY COUPLED PLASMA MASS SPECTROMETRY; MASS SPECTROMETRY; SIGNAL DETECTION; VAPORIZATION;

EID: 0038146852     PISSN: 09106340     EISSN: None     Source Type: Journal    
DOI: 10.2116/analsci.19.791     Document Type: Article

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