The study of c-axis I-V characteristics of Tl:2212 thin film

Physica C: Superconductivity and its Applications

Volumn 388-389, Issue , 2003, Pages 755-756

  Zhang, Guohua ^a   Luo, Sheng ^a   Shen, Qingfei ^b   Li, Chunguang ^b   Lu, Rongtao ^c   Yan, Shaolin ^c   Huang, Saijun ^a   He, Yusheng ^b  

^a UNIVERSITY OF SCIENCE AND TECHNOLOGY BEIJING   (China)

^b INSTITUTE OF PHYSICS   (China)

^c NANKAI UNIVERSITY   (China)

Author keywords

I V characteristics; Modified A H model; Tl:2212 thin film

Indexed keywords

CAPACITANCE; CURRENT VOLTAGE CHARACTERISTICS; JOSEPHSON JUNCTION DEVICES; STRONTIUM COMPOUNDS; SUBSTRATES; THALLIUM COMPOUNDS;

THERMAL-FLUCTUATION MODEL;

THIN FILMS;

EID: 0038137526     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4534(02)02580-7     Document Type: Conference Paper

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