Fault diagnosis in a small constant number of parallel testing rounds

Proceedings of the 5th Annual ACM Symposium on Parallel Algorithms and Architectures, SPAA 1993

Volumn , Issue , 1993, Pages 21-29

  Beigel, Richard ^a,d   Margulis, Grigorii ^a,b,d   Spielman, Daniel A ^c,e  

^a YALE UNIVERSITY   (United States)

^b RUSSIAN ACADEMY OF SCIENCES   (Russian Federation)

^c MIT Company   (Russian Federation)

^d Yale Station   (United States)

^e MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FAULT DETECTION; PARALLEL ALGORITHMS; PARALLEL ARCHITECTURES;

PARALLEL TESTING ROUNDS;

PARALLEL PROCESSING SYSTEMS;

EID: 0038112683     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/165231.165234     Document Type: Conference Paper

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