Microstructure and microchemistry of silicon particles formed during electrical-discharge machining

Journal of Materials Science: Materials in Electronics

Volumn 14, Issue 8, 2003, Pages 507-510

  Davila, Lilian P ^a   Leppert, Valerie J ^a   Risbud, Subhash H ^a  

^a University of California Davis   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL MICROSTRUCTURE; ELECTRIC DISCHARGES; ELECTROCHEMISTRY; ENERGY DISPERSIVE SPECTROSCOPY; MACHINING; MORPHOLOGY; PARTICLE SIZE ANALYSIS; STRUCTURE (COMPOSITION); TRANSMISSION ELECTRON MICROSCOPY; X RAY ANALYSIS; X RAY DIFFRACTION ANALYSIS;

ELECTRICAL DISCHARGE MACHINING; MICROCHEMISTRY; SELECTED AREA ELECTRON DIFFRACTION;

SILICON;

EID: 0038106604     PISSN: 09574522     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1023981103126     Document Type: Article

References (5)

1. Y. Uno, A. Okada, Y. Okamoto, K. Yamazaki and S. H. Risbud, Precis. Eng. 23 (1999) 126.
2. D. Williams and C. B. Carter, "Transmission Electron Microscopy" (Plenum Press, 1996).
3. J. W. Edington, "Practical Electron Microscopy in Materials Science" (Macmillan, 1976).
4. B. D. Cullity, "Elements of X-ray Diffraction" (Addison-Wesley Publishing Company Inc. 1978).
5. G. Thomas and M. J. Goringe, "Transmission Electron Microscopy of Materials" (Wiley, 1979).