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Volumn 82, Issue 26, 2003, Pages 4785-4787
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Spatially direct and indirect transitions observed for Si/Ge quantum dots
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CARRIER CONCENTRATION;
GERMANIUM;
INTERFACES (MATERIALS);
MOLECULAR BEAM EPITAXY;
PHOTOLUMINESCENCE;
SILICON;
EMISSION ENERGY;
SEMICONDUCTOR QUANTUM DOTS;
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EID: 0038105315
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1587259 Document Type: Article |
Times cited : (42)
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References (9)
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