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Volumn 82, Issue 26, 2003, Pages 4785-4787

Spatially direct and indirect transitions observed for Si/Ge quantum dots

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARRIER CONCENTRATION; GERMANIUM; INTERFACES (MATERIALS); MOLECULAR BEAM EPITAXY; PHOTOLUMINESCENCE; SILICON;

EID: 0038105315     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1587259     Document Type: Article
Times cited : (42)

References (9)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.