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Applied Physics Letters

Volumn 60, Issue 23, 1992, Pages 2883-2885

Long-term annealing study of midgap interface-trap charge neutrality

(1) Fleetwood, D M a

a SANDIA NATIONAL LABORATORIES (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0038089462 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.106807 Document Type: Article

Times cited : (46)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.