Analysis of carrier concentration, lifetime, and electron mobility on p-type HgCdTe

Journal of Applied Physics

Volumn 83, Issue 5, 1998, Pages 2586-2592

  Yoo, Sang Dong ^a   Kwack, Kae Dal ^a  

^a Hanyang University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0038062014     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.367019     Document Type: Article

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